Title | Accrual Failure Detectors |
---|---|
Author | Naohiro Hayashibara |
Institution | Japan Advanced Instutite of Science and Technology, Japan |
Year | 2004 |
Committee Chair | Takuya Katayama (JAIST, Japan) |
Dissertation Committee | Adel Cherif (Qatar Univ., Qatar), Xavier Defago
(JAIST, Japan),
Yoichi Shinoda (JAIST, Japan), Richard D. Schlichting (AT&T Labs Research, USA), Makoto Takizawa (Tokyo Denki Univ., Japan) |
Degree | Ph.D. in Information Science |
Abstract | click here |
Dissertation | Accrual Failure Detectors(PDF, 797KB) |